LVEM 5 Benchtop Electron Microscope
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The LVEM 5 benchtop electron microscope is an invaluable microscopy tool that combines high-resolution imaging with nanoscale resolving power in the worlds one and only desktop TEM design. With the ability to operate in TEM, SEM and STEM modes while remaining affordable and simple to use, the LVEM 5 is the perfect tool for any university or research institute working in nanoscale. Join the many leading institutions around the world who trust the LVEM 5 for their imaging needs. Request a detailed no obligations quote today with a few simple clicks.
LVEM 5 Overview
The LVEM 5 is the uniquely designed benchtop low voltage electron microscope that is small enough to fit anywhere nanoscale imaging is needed. A remarkable imaging tool equipped with TEM, SEM and STEM modes and designed to produce detailed and meaningful image results with unmatched contrast of biologic and soft material samples. The LVEM 5 is a benefit to any lab working, researching or studying nanomaterials.
The LVEM 5 is easy to learn, operate and maintain, and has a price that is just a fraction of the cost of a conventional transmission electron microscope. It is a versatile and capable instrument well-suited for any classroom or research lab. The LVEM 5 brings nanoscale to your benchtop.
Imaging Modes
The LVEM 5 provides unmatched versatility by integrating 4 imaging modes into one very capable, yet benchtop sized, microscope. Depending on system configuration the LVEM 5 can alternate between operating as a Desktop Transmission Electron Microscope (TEM), Desktop Scanning Electron Microscope (SEM), Desktop Scanning Transmission Electron Microscope (STEM) and can even provide Electron Diffraction (ED) data without ever having to re-align the column or adjust the sample. This allows both surface and transmission images of the sample to be captured from the same area of interest. The ability of a single instrument to undertake multiple imaging modes can’t be understated, and it is quickly becoming the indispensable tool of choice for many research labs.
TEM Mode
LVEM 5 microscopes can be equipped with either a CCD or Scientific CMOS camera for Transmission Electron Microscopy imaging of nanoparticles and thin sections.
SEM Mode
A Backscatter Electron (BSE) detector offers a stereoscopic view of the sample. With the click of a button, SEM mode is easily accessed to view the same area of interest for topographical information.
STEM Mode
Scanning Transmission Electron Microscopy is made possible with an added STEM detector. This mode allows for transmission images to be obtained from denser materials.
ED Mode
Electron Diffraction provides structural characterization of crystalline materials.
Benchtop Design: Convenient imaging where you need it most
The LVEM 5 has an architecture that departs from traditional models. The benchtop design alone is a significant departure in terms of design & footprint from the classical TEM design. The LVEM 5 is approximately 90% smaller than classical electron microscopes. In contrast to classical architecture of high-contrast TEMs, the electron optic column is very short, making up only ~ 50% of the LVEM 5’s tiny height. This means that the LVEM 5 can be installed in a lab, on a desktop or benchtop; almost anywhere electronimaging is needed with no special facility requirements.
Ingenious design: We worked hard, so you don’t have to
The LVEM 5 marks a radical and refreshing departure from the classical electron microscope in many ways, notably, by being so remarkably simple that anyone can use it. Equipped with multiple imaging modes in a benchtop format, the LVEM 5 is ready to tackle the nanoscale from your benchtop.
5 kV Field Emission Gun – High contrast electron source
The electron source determines in large measure the parameters of the electron microscope. The uniquely-designed Schottky type field emission gun employed by the LVEM 5 has very high brightness and spatial coherency and allows for strong interactions between the emitted electrons and the samples. This is what provides the LVEM 5 with uniquely high contrast.
Permanent magnet lenses: No cooling required
The LVEM instruments are the only TEMs using permanent magnet lenses. This unique feature allows for the miniature architecture of the microscope and eliminates any cooling requirements. Conventional electron microscopes require active cooling to remove considerable heat generated by electric current circulating in the electromagnetic lenses.
No Special Facilities – Installs almost anywhere
As a result of its small footprint and novel column architecture, the LVEM 5 does not require a dedicated room, anti-vibration isolation, special power supply or cooling of any kind, thereby simplifying the instrument’s installation.
Transmission Electron Microscopy: Inline, two stage optics platform
Electron optics
Electron optics provide the initial stages of magnification. The FEG cathode is at the base of the microscope. The electron beam is then shaped by the condenser and objective lenses as electrons travel upwards through the sample. They continue towards the YAG scintillator screen for formation of the initial image. High spatial resolution on the YAG screen enables using high light-optical magnification in a unique two stage magnification system.
TEM BOOST
TEM BOOST is a hardware-based enhancement of the basic TEM imaging mode provides increased total magnification and higher resolving power in the TEM images. A more advanced and powerful projective lens allows for higher magnification and resolution.
Light optics
Light optics that are stable and reliable further magnify the initial image on the YAG screen. There is highly efficient light transport from the luminescent screen into the light optics. A selection of different light objectives allows for a wide range of magnifications.
Image capture is by means of a Scientific CMOS digital camera mounted on the top of the LVEM5. The camera is optimized for low-light, high dynamic range image capture. The magnified image from the light optics is captured for subsequent viewing and analysis.
Scanning Electron Microscopy: Integrated detector for multiple modes
A backscattered electron detector has been directly incorporated into an electron optics column that was originally designed for transmission electron microscopy alone, enabling scanning electron microscopy to be performed in parallel.
Back-scattered electrons are collected by an annular solid-state detector separately for each scanned point. The spatial intensity distribution of the backscattered electrons is used to form the final image in the software.
The combination of selected spot sizes and optimized working distances allow for a wide range of magnifications. The small working distance creates high spatial resolution and a segmented semi-annular detector provides the choices of material of relief contrast.
Scanning Transmission Electron Microscopy – Photomultiplier
With the addition of the STEM photomultiplier, the versatile LVEM 5 has the added capability of scanning transmission microscopy, which can be useful in situations where samples are stained or too thick for conventional TEM imaging.
Motorized Sample Manipulator – Precise sample area selection
The LVEM 5 employs a motorized stage with joystick control of X, Y and Z axis for intuitive sample movement. Joystick sensitivity is dynamic, providing quick motion for low magnification sample screening and fine precision for high magnification imaging.
Ultra-High Vacuum Pumps: Clean column, clean imaging
Column: 2 Ion Getter Pumps
Ion pumps are inherently dry, vibration-free and achieve very high vacuum levels. They use no oil as do mechanical rotary-pumps and diffusion pumps. By making use of specially designed Ion Getter Pumps, the LVEM 5 avoids all contamination in the sample space, resulting in stable imaging conditions and absence of artifacts.
Airlock: Turbomolecular Pump with Diaphragm Pump
A maintenance free turbomolecular pump provides rapid evacuation of the airlock system and provides for quick and clean sample exchange. A self-venting system allows for rapid cycle times.
Controls and Software – Complete imaging control
User operations are facilitated via the ergonomic control panel with simple adjustments for illumination, magnification, image optimization and stage position.
The included PC and monitor is delivered complete with pre-installed intuitive software for microscope operations and imaging. The software allows for monitoring and adjustments of all important microscope parameters and makes it possible to switch seamlessly between all imaging modes.
Image acquisition in all modes is carried out directly within the software, providing the capability for on-screen measurements, statistics and FFT. Image corrections such as image brightness and contrast, live-histogram auto-correction and bit-depth selection are also possible.
Images are saved in non-proprietary formats, which can be imported into your favorite image analysis software, such as ImageJ.
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